Edit a method to configure method parameters and instrument configuration settings for your instrument and method.
Make sure that your method's parameters and instrument configuration are compatible with your current instrument hardware and resources. The system compares your method configuration and the actual instrument configuration before allowing it to be used to acquire data.
In the Acquisition Parameters table, you can specify up to four Scan segments. These scans are acquired for the entire run. You can also add SIM segments to the Acquisition Parameters table. These SIM segments start at the Time that you enter and are acquired until the next time that is specified in the table. Edit the Scan and SIM Segments in the Acquisition section.
Open a method from a previous version (LC/MS)
Method > MS Global Parameters Pane (LC/MS)
Method > Acquisition Section (LC/MS)
Method > Source Section (LC/MS)